Software, Automation & Control :: Instrumentation, Automation & Control :: Analyzers, Gages & Indicators
February 1, 2013
Increasing the sensitivity of trace-element analysis
By using electrothermal vaporization (ETV) for sample introduction, this company has greatly improved the sensitivity of its Arcos ICP-OES spectrometer for material-analysis applications. Trials verify that detection limits can be improved by an order of...
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